Hello Henrik ;
Sorry for the long delay , I had health issues and I return back to my RE-DE table as quick as possible after a quick recovery ...
I've done as you suggested and now I don't have that dependent ADC result changing problem/madness at 500 us acqusition time setting and quickly tried to get the silicon die temperature of two different pic16f1827 and I got almost the same values (one of them reads 496 and the other 497 at the very beginning of the power up..) ... Right after that I started to observe the formulas on AN1333 published by Microchip , I applied the obtained values to the formulas but I get a result which is both good and bad with raw 496 under 10 bits conversion and high range mode(4) ..
According to the formulas I get -28.59 degrees ... Well , now ...
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*The good thing about this reading is that it would be an almost right conversion result if it were a positive valueBecause when I measure the top surface temperature of the PIC with an infrared thermometer in "object measuring mode" , I get 27.12 C' ... NOT BAD when considered the die temp. must be a little more than that !!!
*The bad thing as mentioned above is that its being a negative value
By the way there is a strange thing I keep seeing during I read the application note .. The value 0.00132 is written as 0.0132 in other forms of the calculations ...
However ;
I don't know if it is a victory or a half victory or maybe a coincidence but perhaps there is an entirely different calibration formula for this PIC ...
I'm so curious about your and all others' approaches to this problem who are interested in this built in temp. sensor module ..
Regards
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